Measurement of thin film piezoelectric constants using x-ray diffraction technique
10.1088/0031-8949/2007/T129/078
Saved in:
| Main Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/86017 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-86017 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-860172023-10-25T22:56:28Z Measurement of thin film piezoelectric constants using x-ray diffraction technique Yu, Y.H. Lai, M.O. Lu, L. MECHANICAL ENGINEERING 10.1088/0031-8949/2007/T129/078 Physica Scripta T T129 353-357 PHSTE 2014-10-07T09:14:55Z 2014-10-07T09:14:55Z 2007 Conference Paper Yu, Y.H., Lai, M.O., Lu, L. (2007). Measurement of thin film piezoelectric constants using x-ray diffraction technique. Physica Scripta T T129 : 353-357. ScholarBank@NUS Repository. https://doi.org/10.1088/0031-8949/2007/T129/078 02811847 http://scholarbank.nus.edu.sg/handle/10635/86017 000254342700079 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1088/0031-8949/2007/T129/078 |
| author2 |
MECHANICAL ENGINEERING |
| author_facet |
MECHANICAL ENGINEERING Yu, Y.H. Lai, M.O. Lu, L. |
| format |
Conference or Workshop Item |
| author |
Yu, Y.H. Lai, M.O. Lu, L. |
| spellingShingle |
Yu, Y.H. Lai, M.O. Lu, L. Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| author_sort |
Yu, Y.H. |
| title |
Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| title_short |
Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| title_full |
Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| title_fullStr |
Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| title_full_unstemmed |
Measurement of thin film piezoelectric constants using x-ray diffraction technique |
| title_sort |
measurement of thin film piezoelectric constants using x-ray diffraction technique |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86017 |
| _version_ |
1781784796207251456 |