Measurement of thin film piezoelectric constants using x-ray diffraction technique

10.1088/0031-8949/2007/T129/078

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Bibliographic Details
Main Authors: Yu, Y.H., Lai, M.O., Lu, L.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86017
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Institution: National University of Singapore

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