Measurement of thin film piezoelectric constants using x-ray diffraction technique

10.1088/0031-8949/2007/T129/078

Saved in:
Bibliographic Details
Main Authors: Yu, Y.H., Lai, M.O., Lu, L.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86017
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first