Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films

Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films

10.1063/1.3065473

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Bibliographic Details
Main Authors: Wang, Y., Zheng, R.Y., Sim, C.H., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86212
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Institution: National University of Singapore
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Summary:10.1063/1.3065473

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