Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films
10.1063/1.3065473
Saved in:
Main Authors: | Wang, Y., Zheng, R.Y., Sim, C.H., Wang, J. |
---|---|
Other Authors: | MATERIALS SCIENCE AND ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/86212 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Effect of (Bi,Gd)FeO3 layer thickness on the microstructure and electrical properties of BiFeO3 thin films
by: Wu, J., et al.
Published: (2014) -
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films
by: Wang, Y., et al.
Published: (2014) -
Multiferroic and fatigue behavior of (Bi0.90 La0.10) FeO3 / CoFe2 O4 / (Bi0.90 La0.10) FeO3 sandwich structure
by: Wu, J., et al.
Published: (2014) -
Temperature-dependent electrical behavior of La0.7 Sr 0.3 MnO3 -buffered Bi0.9 La0.1 FeO3 thin films
by: Wang, Y., et al.
Published: (2014) -
Effects of SRO buffer layer on multiferroic BiFeO3 thin films
by: Zheng, R.Y., et al.
Published: (2014)