Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films
10.1063/1.3065473
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sg-nus-scholar.10635-862122023-10-26T20:34:18Z Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films Wang, Y. Zheng, R.Y. Sim, C.H. Wang, J. MATERIALS SCIENCE AND ENGINEERING 10.1063/1.3065473 Journal of Applied Physics 105 1 - JAPIA 2014-10-07T09:48:03Z 2014-10-07T09:48:03Z 2009 Article Wang, Y., Zheng, R.Y., Sim, C.H., Wang, J. (2009). Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films. Journal of Applied Physics 105 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3065473 00218979 http://scholarbank.nus.edu.sg/handle/10635/86212 000262534100182 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1063/1.3065473 |
| author2 |
MATERIALS SCIENCE AND ENGINEERING |
| author_facet |
MATERIALS SCIENCE AND ENGINEERING Wang, Y. Zheng, R.Y. Sim, C.H. Wang, J. |
| format |
Article |
| author |
Wang, Y. Zheng, R.Y. Sim, C.H. Wang, J. |
| spellingShingle |
Wang, Y. Zheng, R.Y. Sim, C.H. Wang, J. Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| author_sort |
Wang, Y. |
| title |
Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| title_short |
Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| title_full |
Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| title_fullStr |
Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| title_full_unstemmed |
Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin films |
| title_sort |
charged defects and their effects on electrical behavior in bi 1-x lax feo3 thin films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86212 |
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1781784827776729088 |