Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness

Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness

10.1007/s10832-006-9901-5

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Bibliographic Details
Main Authors: Gao, X., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Bi4Ti3O12 thin film
Ferroelectric behaviors
FRAM
Layered perovskite structure
Thickness dependence
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86884
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Institution: National University of Singapore
Description
Summary:10.1007/s10832-006-9901-5

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