Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness
10.1007/s10832-006-9901-5
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sg-nus-scholar.10635-868842024-11-11T22:09:30Z Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness Gao, X. Wang, J. MATERIALS SCIENCE AND ENGINEERING Bi4Ti3O12 thin film Ferroelectric behaviors FRAM Layered perovskite structure Thickness dependence 10.1007/s10832-006-9901-5 Journal of Electroceramics 16 4 477-481 JOELF 2014-10-07T09:55:57Z 2014-10-07T09:55:57Z 2006-07 Conference Paper Gao, X., Wang, J. (2006-07). Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness. Journal of Electroceramics 16 (4) : 477-481. ScholarBank@NUS Repository. https://doi.org/10.1007/s10832-006-9901-5 13853449 http://scholarbank.nus.edu.sg/handle/10635/86884 000241750700042 Scopus |
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Bi4Ti3O12 thin film Ferroelectric behaviors FRAM Layered perovskite structure Thickness dependence |
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Bi4Ti3O12 thin film Ferroelectric behaviors FRAM Layered perovskite structure Thickness dependence Gao, X. Wang, J. Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
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10.1007/s10832-006-9901-5 |
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MATERIALS SCIENCE AND ENGINEERING |
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MATERIALS SCIENCE AND ENGINEERING Gao, X. Wang, J. |
format |
Conference or Workshop Item |
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Gao, X. Wang, J. |
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Gao, X. |
title |
Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
title_short |
Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
title_full |
Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
title_fullStr |
Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
title_full_unstemmed |
Ferroelectric properties of (Bi3.15Nd0.85)Ti 3O12 with decreasing film thickness |
title_sort |
ferroelectric properties of (bi3.15nd0.85)ti 3o12 with decreasing film thickness |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/86884 |
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