Gauge capability assessment for high-yield manufacturing processes with truncated distribution

Quality Engineering

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Bibliographic Details
Main Authors: Yock Wah Lai, Ek Peng Chew
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87022
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-870222015-02-19T10:32:23Z Gauge capability assessment for high-yield manufacturing processes with truncated distribution Yock Wah Lai Ek Peng Chew INDUSTRIAL & SYSTEMS ENGINEERING Gauge capability study Measurement error Measurement system Nonparametric Process capability index Truncated distribution Quality Engineering 13 2 203-210 QUENE 2014-10-07T10:23:23Z 2014-10-07T10:23:23Z 2000-12 Article Yock Wah Lai,Ek Peng Chew (2000-12). Gauge capability assessment for high-yield manufacturing processes with truncated distribution. Quality Engineering 13 (2) : 203-210. ScholarBank@NUS Repository. 08982112 http://scholarbank.nus.edu.sg/handle/10635/87022 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Gauge capability study
Measurement error
Measurement system
Nonparametric
Process capability index
Truncated distribution
spellingShingle Gauge capability study
Measurement error
Measurement system
Nonparametric
Process capability index
Truncated distribution
Yock Wah Lai
Ek Peng Chew
Gauge capability assessment for high-yield manufacturing processes with truncated distribution
description Quality Engineering
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Yock Wah Lai
Ek Peng Chew
format Article
author Yock Wah Lai
Ek Peng Chew
author_sort Yock Wah Lai
title Gauge capability assessment for high-yield manufacturing processes with truncated distribution
title_short Gauge capability assessment for high-yield manufacturing processes with truncated distribution
title_full Gauge capability assessment for high-yield manufacturing processes with truncated distribution
title_fullStr Gauge capability assessment for high-yield manufacturing processes with truncated distribution
title_full_unstemmed Gauge capability assessment for high-yield manufacturing processes with truncated distribution
title_sort gauge capability assessment for high-yield manufacturing processes with truncated distribution
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/87022
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