Gauge capability assessment for high-yield manufacturing processes with truncated distribution

• Main Authors: Yock Wah Lai, Ek Peng Chew
• Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Gauge capability study; Measurement error; Measurement system; Nonparametric; Process capability index; Truncated distribution
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/87022
• Institution: National University of Singapore

Quality Engineering