Nonparametric estimation of decreasing mean residual life with type II censored data

IEEE Transactions on Reliability

Saved in:
Bibliographic Details
Main Authors: Shen, Y., Xie, M., Tang, L.C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87102
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items