Planning accelerated life tests with three constant stress levels
Computers and Industrial Engineering
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2014
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sg-nus-scholar.10635-873752023-08-22T08:04:40Z Planning accelerated life tests with three constant stress levels Tang, L.-C. Tan, A.-P. Ong, S.-H. INDUSTRIAL & SYSTEMS ENGINEERING Accelerated life testing Multiple stress levels Weibull distribution Computers and Industrial Engineering 42 2-4 439-446 CINDD 2014-10-07T10:27:26Z 2014-10-07T10:27:26Z 2002-04-11 Conference Paper Tang, L.-C., Tan, A.-P., Ong, S.-H. (2002-04-11). Planning accelerated life tests with three constant stress levels. Computers and Industrial Engineering 42 (2-4) : 439-446. ScholarBank@NUS Repository. 03608352 http://scholarbank.nus.edu.sg/handle/10635/87375 000175735300036 Scopus |
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Accelerated life testing Multiple stress levels Weibull distribution |
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Accelerated life testing Multiple stress levels Weibull distribution Tang, L.-C. Tan, A.-P. Ong, S.-H. Planning accelerated life tests with three constant stress levels |
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Computers and Industrial Engineering |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Tang, L.-C. Tan, A.-P. Ong, S.-H. |
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Conference or Workshop Item |
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Tang, L.-C. Tan, A.-P. Ong, S.-H. |
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Tang, L.-C. |
title |
Planning accelerated life tests with three constant stress levels |
title_short |
Planning accelerated life tests with three constant stress levels |
title_full |
Planning accelerated life tests with three constant stress levels |
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Planning accelerated life tests with three constant stress levels |
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Planning accelerated life tests with three constant stress levels |
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planning accelerated life tests with three constant stress levels |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/87375 |
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