Planning accelerated life tests with three constant stress levels

• Main Authors: Tang, L.-C., Tan, A.-P., Ong, S.-H.
• Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Accelerated life testing; Multiple stress levels; Weibull distribution
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/87375
• Institution: National University of Singapore

Computers and Industrial Engineering