In situ photoemission spectroscopy study on formation of HfO2 dielectrics on epitaxial graphene on SiC substrate

In situ photoemission spectroscopy study on formation of HfO2 dielectrics on epitaxial graphene on SiC substrate

10.1063/1.3327834

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Bibliographic Details
Main Authors: Chen, Q., Huang, H., Chen, W., Wee, A.T.S., Feng, Y.P., Chai, J.W., Zhang, Z., Pan, J.S., Wang, S.J.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/94020
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Institution: National University of Singapore
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Summary:10.1063/1.3327834

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