A resonant cavity for high-accuracy measurement of microwave dielectric properties
10.1088/0957-0233/7/9/010
Saved in:
Main Authors: | Chen, L., Ong, C.K., Tan, B.T.G. |
---|---|
其他作者: | PHYSICS |
格式: | Article |
出版: |
2014
|
在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/95678 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | National University of Singapore |
相似書籍
-
Microwave dielectric resonance of a fluoride glass
由: Taijing, L., et al.
出版: (2014) -
Effects of impurities on dielectric properties of fluorozirconate glasses at microwave frequencies
由: Ding, X.Z., et al.
出版: (2014) -
Microwave dielectric relaxation of silicon crystals
由: Ding, X.Z., et al.
出版: (2014) -
Study of dielectric and electrical properties of mortar in the early hydration period at microwave frequencies
由: Ding, X.Z., et al.
出版: (2014) -
Vacuum pump coaxial probe system for measurement of dielectric properties of materials with smooth surfaces
由: Ding, X.Z., et al.
出版: (2014)