Channeling contrast microscopy of epitaxial lateral overgrowth of ZnO/GaN films
10.1016/j.nimb.2007.02.037
Saved in:
Main Authors: | Zhou, H., Pan, H., Chan, T.K., Ho, C.S., Feng, Y., Chua, S.-J., Osipowicz, T. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95944 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Controlled facet growth of GaN and the overgrowth with ZnO
by: ZHOU HAILONG
Published: (2011) -
2 MeV proton channeling contrast microscopy of LEO GaN thin film structures
by: Osipowicz, T., et al.
Published: (2014) -
High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
by: Osipowicz, T., et al.
Published: (2014) -
Sub-micron channeling contrast microscopy on reactive ion etched deep Si microstructures
by: Teo, E.J., et al.
Published: (2014) -
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers
by: Seng, H.L., et al.
Published: (2014)