High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers

High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers

10.1016/S0168-583X(03)01090-5

Saved in:
Bibliographic Details
Main Authors: Seng, H.L., Osipowicz, T., Sum, T.C., Breese, M.B.H., Watt, F., Tok, E.S., Zhang, J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Channeling contrast microscopy
SiGe
Virtual substrate
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98741
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/98741

Similar Items