High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers
10.1016/S0168-583X(03)01090-5
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2014
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sg-nus-scholar.10635-987412023-10-25T23:05:03Z High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers Seng, H.L. Osipowicz, T. Sum, T.C. Breese, M.B.H. Watt, F. Tok, E.S. Zhang, J. PHYSICS MATERIALS SCIENCE Channeling contrast microscopy SiGe Virtual substrate 10.1016/S0168-583X(03)01090-5 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 210 483-488 NIMBE 2014-10-16T09:50:53Z 2014-10-16T09:50:53Z 2003-09 Conference Paper Seng, H.L., Osipowicz, T., Sum, T.C., Breese, M.B.H., Watt, F., Tok, E.S., Zhang, J. (2003-09). High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 210 : 483-488. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(03)01090-5 0168583X http://scholarbank.nus.edu.sg/handle/10635/98741 000185352300090 Scopus |
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National University of Singapore |
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NUS Library |
| continent |
Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
Channeling contrast microscopy SiGe Virtual substrate |
| spellingShingle |
Channeling contrast microscopy SiGe Virtual substrate Seng, H.L. Osipowicz, T. Sum, T.C. Breese, M.B.H. Watt, F. Tok, E.S. Zhang, J. High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| description |
10.1016/S0168-583X(03)01090-5 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Seng, H.L. Osipowicz, T. Sum, T.C. Breese, M.B.H. Watt, F. Tok, E.S. Zhang, J. |
| format |
Conference or Workshop Item |
| author |
Seng, H.L. Osipowicz, T. Sum, T.C. Breese, M.B.H. Watt, F. Tok, E.S. Zhang, J. |
| author_sort |
Seng, H.L. |
| title |
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| title_short |
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| title_full |
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| title_fullStr |
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| title_full_unstemmed |
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers |
| title_sort |
high-resolution channeling contrast microscopy of compositionally graded si1-xgex layers |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/98741 |
| _version_ |
1781786940531539968 |