High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers

10.1016/S0168-583X(03)01090-5

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Bibliographic Details
Main Authors: Seng, H.L., Osipowicz, T., Sum, T.C., Breese, M.B.H., Watt, F., Tok, E.S., Zhang, J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98741
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Institution: National University of Singapore

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