Determination of Raman phonon strain shift coefficient of strained silicon and strained SiGe

Determination of Raman phonon strain shift coefficient of strained silicon and strained SiGe

10.1143/JJAP.44.7922

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Bibliographic Details
Main Authors: Wong, L.H., Wong, C.C., Liu, J.P., Sohn, D.K., Chan, L., Hsia, L.C., Zang, H., Ni, Z.H., Shen, Z.X.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Measurement
Phonon strain shift coefficient
Raman
Strain
Strained Si
Strained SiGe
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96198
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/96198

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