Determination of Raman phonon strain shift coefficient of strained silicon and strained SiGe

10.1143/JJAP.44.7922

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Bibliographic Details
Main Authors:	Wong, L.H., Wong, C.C., Liu, J.P., Sohn, D.K., Chan, L., Hsia, L.C., Zang, H., Ni, Z.H., Shen, Z.X.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Subjects:	Measurement Phonon strain shift coefficient Raman Strain Strained Si Strained SiGe
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/96198
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Institution:	National University of Singapore

Description
Summary:	10.1143/JJAP.44.7922

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