Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy
10.1007/s00339-004-3076-1
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| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Review |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/99014 |
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| Institution: | National University of Singapore |