Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy
10.1007/s00339-004-3076-1
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2014
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sg-nus-scholar.10635-990142024-11-15T07:05:19Z Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy Seng, H.L. Osipowicz, T. Zhang, J. Tok, E.S. PHYSICS MATERIALS SCIENCE 10.1007/s00339-004-3076-1 Applied Physics A: Materials Science and Processing 81 6 1163-1166 APAMF 2014-10-16T09:54:09Z 2014-10-16T09:54:09Z 2005-11 Review Seng, H.L., Osipowicz, T., Zhang, J., Tok, E.S. (2005-11). Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy. Applied Physics A: Materials Science and Processing 81 (6) : 1163-1166. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-004-3076-1 09478396 http://scholarbank.nus.edu.sg/handle/10635/99014 000231599900012 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1007/s00339-004-3076-1 |
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PHYSICS |
| author_facet |
PHYSICS Seng, H.L. Osipowicz, T. Zhang, J. Tok, E.S. |
| format |
Review |
| author |
Seng, H.L. Osipowicz, T. Zhang, J. Tok, E.S. |
| spellingShingle |
Seng, H.L. Osipowicz, T. Zhang, J. Tok, E.S. Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| author_sort |
Seng, H.L. |
| title |
Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| title_short |
Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| title_full |
Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| title_fullStr |
Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| title_full_unstemmed |
Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopy |
| title_sort |
observation of local lattice tilts in strain-relaxed si 1-xgex using high resolution channeling contrast microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/99014 |
| _version_ |
1821222203637628928 |