Characterization of silicon germanium systems using nuclear microscopy techniques

Characterization of silicon germanium systems using nuclear microscopy techniques

Ph.D

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Bibliographic Details
Main Author: SENG HWEE LENG, DEBBIE
Other Authors: PHYSICS
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
silicon germanium, virtual substrates, gas source molecular beam epitaxy, strain relaxation, channeling contrast microscopy, beam rocking
Online Access:https://scholarbank.nus.edu.sg/handle/10635/14508
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Institution: National University of Singapore
Language: English

Internet

https://scholarbank.nus.edu.sg/handle/10635/14508

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