Characterization of silicon germanium systems using nuclear microscopy techniques

Ph.D

Saved in:

Bibliographic Details
Main Author:	SENG HWEE LENG, DEBBIE
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	silicon germanium, virtual substrates, gas source molecular beam epitaxy, strain relaxation, channeling contrast microscopy, beam rocking
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/14508
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-14508
record_format	dspace
spelling	sg-nus-scholar.10635-145082020-11-18T03:04:21Z Characterization of silicon germanium systems using nuclear microscopy techniques SENG HWEE LENG, DEBBIE PHYSICS OSIPOWICZ, THOMAS MARK B H BREESE silicon germanium, virtual substrates, gas source molecular beam epitaxy, strain relaxation, channeling contrast microscopy, beam rocking Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:43:53Z 2010-04-08T10:43:53Z 2005-01-31 Thesis SENG HWEE LENG, DEBBIE (2005-01-31). Characterization of silicon germanium systems using nuclear microscopy techniques. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/14508 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	silicon germanium, virtual substrates, gas source molecular beam epitaxy, strain relaxation, channeling contrast microscopy, beam rocking
spellingShingle	silicon germanium, virtual substrates, gas source molecular beam epitaxy, strain relaxation, channeling contrast microscopy, beam rocking SENG HWEE LENG, DEBBIE Characterization of silicon germanium systems using nuclear microscopy techniques
description	Ph.D
author2	PHYSICS
author_facet	PHYSICS SENG HWEE LENG, DEBBIE
format	Theses and Dissertations
author	SENG HWEE LENG, DEBBIE
author_sort	SENG HWEE LENG, DEBBIE
title	Characterization of silicon germanium systems using nuclear microscopy techniques
title_short	Characterization of silicon germanium systems using nuclear microscopy techniques
title_full	Characterization of silicon germanium systems using nuclear microscopy techniques
title_fullStr	Characterization of silicon germanium systems using nuclear microscopy techniques
title_full_unstemmed	Characterization of silicon germanium systems using nuclear microscopy techniques
title_sort	characterization of silicon germanium systems using nuclear microscopy techniques
publishDate	2010
url	https://scholarbank.nus.edu.sg/handle/10635/14508
_version_	1684664522583834624

Characterization of silicon germanium systems using nuclear microscopy techniques

Similar Items