Characterization of silicon germanium systems using nuclear microscopy techniques
Ph.D
Saved in:
Main Author: | SENG HWEE LENG, DEBBIE |
---|---|
Other Authors: | PHYSICS |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2010
|
Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/14508 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Language: | English |
Similar Items
-
High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
by: Osipowicz, T., et al.
Published: (2014) -
Strained silicon-germanium-on-insulator n-channel transistor with silicon source and drain regions for performance enhancement
by: Wang, G.H., et al.
Published: (2014) -
High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers
by: Seng, H.L., et al.
Published: (2014) -
Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopy
by: Seng, H.L., et al.
Published: (2014) -
Spintronic THz Generation Using a Silicon-based Fe/Pt Bilayer as the Radiation Source
by: Mag-Usara, Valynn Katrine, et al.
Published: (2019)