Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD

• Main Authors: Chen, H.Y., Lin, J., Tan, K.L., Feng, Z.C.
• 其他作者: PHYSICS
• 格式: Article
• 出版: 2014
• 主題: Chemical vapour deposition; Fourier transform infrared spectroscopy; Raman scattering; X-ray diffraction; X-ray photoelectron spectroscopy
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/95962

Thin Solid Films