Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD

Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD

Thin Solid Films

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Bibliographic Details
Main Authors: Chen, H.Y., Lin, J., Tan, K.L., Feng, Z.C.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Chemical vapour deposition
Fourier transform infrared spectroscopy
Raman scattering
X-ray diffraction
X-ray photoelectron spectroscopy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95962
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/95962

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