Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD

• Main Authors: Chen, H.Y., Lin, J., Tan, K.L., Feng, Z.C.
• Other Authors: PHYSICS
• Format: Article
• Published: 2014
• Subjects: Chemical vapour deposition; Fourier transform infrared spectroscopy; Raman scattering; X-ray diffraction; X-ray photoelectron spectroscopy
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/95962
• Institution: National University of Singapore

Thin Solid Films