Depth resolution studies in SiGe delta-doped multilayers using ultralow-energy O2 + secondary-ion-mass spectrometry
10.1116/1.2167986
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Main Authors: | , |
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Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96174 |
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Institution: | National University of Singapore |