Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique
10.1063/1.354928
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96217 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-96217 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-962172023-10-26T09:24:22Z Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique Oh, K.H. Le Gressus, C. Gong, H. Ong, C.K. Tan, B.T.G. Ding, X.Z. PHYSICS 10.1063/1.354928 Journal of Applied Physics 74 2 1250-1255 2014-10-16T09:20:54Z 2014-10-16T09:20:54Z 1993 Article Oh, K.H., Le Gressus, C., Gong, H., Ong, C.K., Tan, B.T.G., Ding, X.Z. (1993). Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique. Journal of Applied Physics 74 (2) : 1250-1255. ScholarBank@NUS Repository. https://doi.org/10.1063/1.354928 00218979 http://scholarbank.nus.edu.sg/handle/10635/96217 A1993LM78200076 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.354928 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Oh, K.H. Le Gressus, C. Gong, H. Ong, C.K. Tan, B.T.G. Ding, X.Z. |
| format |
Article |
| author |
Oh, K.H. Le Gressus, C. Gong, H. Ong, C.K. Tan, B.T.G. Ding, X.Z. |
| spellingShingle |
Oh, K.H. Le Gressus, C. Gong, H. Ong, C.K. Tan, B.T.G. Ding, X.Z. Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| author_sort |
Oh, K.H. |
| title |
Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| title_short |
Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| title_full |
Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| title_fullStr |
Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| title_full_unstemmed |
Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique |
| title_sort |
dielectric polarization relaxation measurement in α-sio2 by means of a scanning electron microscope technique |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/96217 |
| _version_ |
1781786410004512768 |