Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique

Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique

10.1063/1.354928

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Bibliographic Details
Main Authors: Oh, K.H., Le Gressus, C., Gong, H., Ong, C.K., Tan, B.T.G., Ding, X.Z.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96217
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Institution: National University of Singapore

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