Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique

• Main Authors: Oh, K.H., Le Gressus, C., Gong, H., Ong, C.K., Tan, B.T.G., Ding, X.Z.
• Other Authors: PHYSICS
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/96217
• Institution: National University of Singapore

10.1063/1.354928