Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

10.1063/1.2001748

Saved in:
Bibliographic Details
Main Authors: Sum, T.C., Bettiol, A.A., Van Kan, J.A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E.Y.B.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96235
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1063/1.2001748

Similar Items