Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

10.1063/1.2001748

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Bibliographic Details
Main Authors:	Sum, T.C., Bettiol, A.A., Van Kan, J.A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E.Y.B.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/96235
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Institution:	National University of Singapore

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