Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

10.1063/1.2001748

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Bibliographic Details
Main Authors:	Sum, T.C., Bettiol, A.A., Van Kan, J.A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E.Y.B.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/96235
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-962352023-10-25T07:38:05Z Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy Sum, T.C. Bettiol, A.A. Van Kan, J.A. Venugopal Rao, S. Watt, F. Liu, K. Pun, E.Y.B. PHYSICS 10.1063/1.2001748 Journal of Applied Physics 98 3 - JAPIA 2014-10-16T09:21:05Z 2014-10-16T09:21:05Z 2005-08-01 Article Sum, T.C., Bettiol, A.A., Van Kan, J.A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E.Y.B. (2005-08-01). Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy. Journal of Applied Physics 98 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2001748 00218979 http://scholarbank.nus.edu.sg/handle/10635/96235 000231246100041 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.2001748
author2	PHYSICS
author_facet	PHYSICS Sum, T.C. Bettiol, A.A. Van Kan, J.A. Venugopal Rao, S. Watt, F. Liu, K. Pun, E.Y.B.
format	Article
author	Sum, T.C. Bettiol, A.A. Van Kan, J.A. Venugopal Rao, S. Watt, F. Liu, K. Pun, E.Y.B.
spellingShingle	Sum, T.C. Bettiol, A.A. Van Kan, J.A. Venugopal Rao, S. Watt, F. Liu, K. Pun, E.Y.B. Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
author_sort	Sum, T.C.
title	Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
title_short	Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
title_full	Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
title_fullStr	Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
title_full_unstemmed	Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
title_sort	direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/96235
_version_	1781786414274314240

Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

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