Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope

10.1063/1.1784035

Saved in:

Bibliographic Details
Main Authors:	Sum, T.C., Bettiol, A.A., Seng, H.L., Van Kan, J.A., Watt, F.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/96238
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-96238
record_format	dspace
spelling	sg-nus-scholar.10635-962382023-10-30T07:26:36Z Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope Sum, T.C. Bettiol, A.A. Seng, H.L. Van Kan, J.A. Watt, F. PHYSICS 10.1063/1.1784035 Applied Physics Letters 85 8 1398-1400 APPLA 2014-10-16T09:21:07Z 2014-10-16T09:21:07Z 2004-08-23 Article Sum, T.C., Bettiol, A.A., Seng, H.L., Van Kan, J.A., Watt, F. (2004-08-23). Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope. Applied Physics Letters 85 (8) : 1398-1400. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1784035 00036951 http://scholarbank.nus.edu.sg/handle/10635/96238 000223375100030 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1784035
author2	PHYSICS
author_facet	PHYSICS Sum, T.C. Bettiol, A.A. Seng, H.L. Van Kan, J.A. Watt, F.
format	Article
author	Sum, T.C. Bettiol, A.A. Seng, H.L. Van Kan, J.A. Watt, F.
spellingShingle	Sum, T.C. Bettiol, A.A. Seng, H.L. Van Kan, J.A. Watt, F. Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
author_sort	Sum, T.C.
title	Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
title_short	Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
title_full	Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
title_fullStr	Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
title_full_unstemmed	Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
title_sort	direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/96238
_version_	1781786415183429632

Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope

Similar Items