Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope

10.1063/1.1784035

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Bibliographic Details
Main Authors: Sum, T.C., Bettiol, A.A., Seng, H.L., Van Kan, J.A., Watt, F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96238
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Institution: National University of Singapore

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