Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
10.1063/1.1784035
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Main Authors: | Sum, T.C., Bettiol, A.A., Seng, H.L., Van Kan, J.A., Watt, F. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96238 |
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Institution: | National University of Singapore |
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