In situ reflection high-energy electron diffraction observation of epitaxial LaNiO3 thin films

Journal of Applied Physics

Saved in:
Bibliographic Details
Main Authors: Chen, P., Xu, S.Y., Zhou, W.Z., Ong, C.K., Cui, D.F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96893
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore