In situ reflection high-energy electron diffraction observation of epitaxial LaNiO3 thin films
Journal of Applied Physics
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Main Authors: | Chen, P., Xu, S.Y., Zhou, W.Z., Ong, C.K., Cui, D.F. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96893 |
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Institution: | National University of Singapore |
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