Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy
10.1016/S0040-6090(99)00882-2
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sg-nus-scholar.10635-969772023-08-31T08:25:20Z Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy Zhu, F. Huan, C.H.A. Zhang, K. Wee, A.T.S. PHYSICS 10.1016/S0040-6090(99)00882-2 Thin Solid Films 359 2 244-250 THSFA 2014-10-16T09:29:50Z 2014-10-16T09:29:50Z 2000-01-31 Article Zhu, F., Huan, C.H.A., Zhang, K., Wee, A.T.S. (2000-01-31). Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy. Thin Solid Films 359 (2) : 244-250. ScholarBank@NUS Repository. https://doi.org/10.1016/S0040-6090(99)00882-2 00406090 http://scholarbank.nus.edu.sg/handle/10635/96977 000084847700022 Scopus |
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10.1016/S0040-6090(99)00882-2 |
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PHYSICS Zhu, F. Huan, C.H.A. Zhang, K. Wee, A.T.S. |
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Zhu, F. Huan, C.H.A. Zhang, K. Wee, A.T.S. |
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Zhu, F. Huan, C.H.A. Zhang, K. Wee, A.T.S. Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
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Zhu, F. |
title |
Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
title_short |
Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
title_full |
Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
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Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
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Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
title_sort |
investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/96977 |
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