Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy

10.1016/S0040-6090(99)00882-2

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Bibliographic Details
Main Authors: Zhu, F., Huan, C.H.A., Zhang, K., Wee, A.T.S.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/96977
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Institution: National University of Singapore

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