Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy
10.1016/S0040-6090(99)00882-2
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Main Authors: | Zhu, F., Huan, C.H.A., Zhang, K., Wee, A.T.S. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96977 |
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Institution: | National University of Singapore |
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