Ionization probability of Si+ ion emission from clean Si under Ar+ bombardment

10.1088/0953-8984/9/43/025

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Bibliographic Details
Main Authors:	Low, M.H.S., Huan, C.H.A., Wee, A.T.S., Tan, K.L.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/97002
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Institution:	National University of Singapore

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Summary:	10.1088/0953-8984/9/43/025

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