Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
10.1063/1.1474597
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sg-nus-scholar.10635-976182024-11-15T07:05:16Z Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy Seng, H.L. Osipowicz, T. Sum, T.C. Tok, E.S. Breton, G. Woods, N.J. Zhang, J. PHYSICS MATERIALS SCIENCE 10.1063/1.1474597 Applied Physics Letters 80 16 2940-2942 APPLA 2014-10-16T09:37:22Z 2014-10-16T09:37:22Z 2002-04-22 Article Seng, H.L., Osipowicz, T., Sum, T.C., Tok, E.S., Breton, G., Woods, N.J., Zhang, J. (2002-04-22). Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy. Applied Physics Letters 80 (16) : 2940-2942. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1474597 00036951 http://scholarbank.nus.edu.sg/handle/10635/97618 000175068900041 Scopus |
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PHYSICS Seng, H.L. Osipowicz, T. Sum, T.C. Tok, E.S. Breton, G. Woods, N.J. Zhang, J. |
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Seng, H.L. Osipowicz, T. Sum, T.C. Tok, E.S. Breton, G. Woods, N.J. Zhang, J. |
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Seng, H.L. Osipowicz, T. Sum, T.C. Tok, E.S. Breton, G. Woods, N.J. Zhang, J. Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
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Seng, H.L. |
title |
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
title_short |
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
title_full |
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
title_fullStr |
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
title_full_unstemmed |
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy |
title_sort |
probing the sige virtual substrate by high-resolution channeling contrast microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/97618 |
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1821206961575690240 |