Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy

10.1063/1.1474597

Saved in:
Bibliographic Details
Main Authors: Seng, H.L., Osipowicz, T., Sum, T.C., Tok, E.S., Breton, G., Woods, N.J., Zhang, J.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/97618
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-97618
record_format dspace
spelling sg-nus-scholar.10635-976182024-11-15T07:05:16Z Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy Seng, H.L. Osipowicz, T. Sum, T.C. Tok, E.S. Breton, G. Woods, N.J. Zhang, J. PHYSICS MATERIALS SCIENCE 10.1063/1.1474597 Applied Physics Letters 80 16 2940-2942 APPLA 2014-10-16T09:37:22Z 2014-10-16T09:37:22Z 2002-04-22 Article Seng, H.L., Osipowicz, T., Sum, T.C., Tok, E.S., Breton, G., Woods, N.J., Zhang, J. (2002-04-22). Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy. Applied Physics Letters 80 (16) : 2940-2942. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1474597 00036951 http://scholarbank.nus.edu.sg/handle/10635/97618 000175068900041 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1474597
author2 PHYSICS
author_facet PHYSICS
Seng, H.L.
Osipowicz, T.
Sum, T.C.
Tok, E.S.
Breton, G.
Woods, N.J.
Zhang, J.
format Article
author Seng, H.L.
Osipowicz, T.
Sum, T.C.
Tok, E.S.
Breton, G.
Woods, N.J.
Zhang, J.
spellingShingle Seng, H.L.
Osipowicz, T.
Sum, T.C.
Tok, E.S.
Breton, G.
Woods, N.J.
Zhang, J.
Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
author_sort Seng, H.L.
title Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
title_short Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
title_full Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
title_fullStr Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
title_full_unstemmed Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy
title_sort probing the sige virtual substrate by high-resolution channeling contrast microscopy
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/97618
_version_ 1821206961575690240