Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix

Materials Research Society Symposium - Proceedings

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Main Authors:	Jie, Y.X., Huan, Cha, Wee, A.T.S., Shen, Z.X.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/97736
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-977362015-02-25T21:58:33Z Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix Jie, Y.X. Huan, Cha Wee, A.T.S. Shen, Z.X. PHYSICS Materials Research Society Symposium - Proceedings 581 597-602 MRSPD 2014-10-16T09:38:43Z 2014-10-16T09:38:43Z 2000 Article Jie, Y.X.,Huan, Cha,Wee, A.T.S.,Shen, Z.X. (2000). Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix. Materials Research Society Symposium - Proceedings 581 : 597-602. ScholarBank@NUS Repository. 02729172 http://scholarbank.nus.edu.sg/handle/10635/97736 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Materials Research Society Symposium - Proceedings
author2	PHYSICS
author_facet	PHYSICS Jie, Y.X. Huan, Cha Wee, A.T.S. Shen, Z.X.
format	Article
author	Jie, Y.X. Huan, Cha Wee, A.T.S. Shen, Z.X.
spellingShingle	Jie, Y.X. Huan, Cha Wee, A.T.S. Shen, Z.X. Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
author_sort	Jie, Y.X.
title	Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
title_short	Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
title_full	Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
title_fullStr	Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
title_full_unstemmed	Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix
title_sort	raman shift and broadening in stress-minimized ge nanocrystals in silicon oxide matrix
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/97736
_version_	1681091895578591232

Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrix

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