Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure
Applied Physics Letters
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sg-nus-scholar.10635-978452015-02-24T13:54:45Z Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure Huang, Y.S. Sun, W.D. Malikova, L. Pollak, F.H. Ferguson, I. Hou, H. Feng, Z.C. Ryan, T. Fantner, E.B. PHYSICS Applied Physics Letters 74 13 1851-1853 APPLA 2014-10-16T09:40:00Z 2014-10-16T09:40:00Z 1999-03-29 Article Huang, Y.S.,Sun, W.D.,Malikova, L.,Pollak, F.H.,Ferguson, I.,Hou, H.,Feng, Z.C.,Ryan, T.,Fantner, E.B. (1999-03-29). Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure. Applied Physics Letters 74 (13) : 1851-1853. ScholarBank@NUS Repository. 00036951 http://scholarbank.nus.edu.sg/handle/10635/97845 NOT_IN_WOS Scopus |
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Applied Physics Letters |
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PHYSICS Huang, Y.S. Sun, W.D. Malikova, L. Pollak, F.H. Ferguson, I. Hou, H. Feng, Z.C. Ryan, T. Fantner, E.B. |
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Huang, Y.S. Sun, W.D. Malikova, L. Pollak, F.H. Ferguson, I. Hou, H. Feng, Z.C. Ryan, T. Fantner, E.B. |
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Huang, Y.S. Sun, W.D. Malikova, L. Pollak, F.H. Ferguson, I. Hou, H. Feng, Z.C. Ryan, T. Fantner, E.B. Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
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Huang, Y.S. |
title |
Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
title_short |
Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
title_full |
Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
title_fullStr |
Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
title_full_unstemmed |
Room-temperature photoluminescence, contactless electroreflectance, and X-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure |
title_sort |
room-temperature photoluminescence, contactless electroreflectance, and x-ray characterization of a double-side delta-doped gaalas/ingaas high electron mobility transistor structure |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/97845 |
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1681091915777310720 |