Transient capacitance measurements of laser radiation-induced defects in silicon

10.1088/0268-1242/5/7/004

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Bibliographic Details
Main Authors:	Tan, H.S., Ng, S.C., Woon, H.S., Hultquist, G.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/98433
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Institution:	National University of Singapore

Description
Summary:	10.1088/0268-1242/5/7/004

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