White light interferometry for surface profiling with a colour CCD

White light interferometry for surface profiling with a colour CCD

10.1016/j.optlaseng.2012.02.002

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Bibliographic Details
Main Authors: Kumar, U.P., Haifeng, W., Mohan, N.K., Kothiyal, M.P.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Fringe analysis
Phase shifting
Single-chip colour CCD camera
Surface profiling
White light interferometry
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98582
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/98582

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