Novel Regrowth-Free Vertical Active-Passive Integration Scheme with Improved Fabrication Tolerance

• Main Authors: TEE, Chyng Wen, Williams, K. A., Penty, R. V., White, I. H., Troppenz, U., Hamacher, M., Heidrich, H.
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2005
• Subjects: Buildings; Computer architecture; Coupling circuits; High speed optical techniques; Integrated optoelectronics; Optical device fabrication; Optical waveguides; Systems engineering and theory; Wafer bonding; Waveguide theory; Physical Sciences and Mathematics
• Online Access: https://ink.library.smu.edu.sg/lkcsb_research/3350; https://doi.org/10.1109/QELS.2005.1548992
• Institution: Singapore Management University

We present a novel vertically-coupled active-passive integration architecture that provides an order of magnitude reduction in coupling coefficient variation between misaligned waveguides when compared with a conventional vertically-coupled structure.