Decoding of DBEC-TBED Reed-Solomon Codes

• Main Authors: DENG, Robert H., COSTELLO, Daniel J. Jr.
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 1987
• Subjects: Byte error correction and detection; byte-organized memory systems; error control coding; Reed-Solomon codes; VLSI memory systems; Information Security
• Online Access: https://ink.library.smu.edu.sg/sis_research/149; https://ink.library.smu.edu.sg/context/sis_research/article/1148/viewcontent/Decoding_DBEC_TBED_1987.pdf
• Institution: Singapore Management University

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K bit DRAM's are orga...