Effort-aware just-in-time defect identification in practice: A case study at Alibaba

• Main Authors: YAN, Meng, XIA, Xin, FAN, Yuanrui, LO, David, HASSAN, Ahmed E., ZHANG, Xindong
• 格式: text
• 語言: English
• 出版: Institutional Knowledge at Singapore Management University 2020
• 主題: Just-in-time defect identification; industrial study; effort-aware; Software Engineering
• 在線閱讀: https://ink.library.smu.edu.sg/sis_research/5629; https://ink.library.smu.edu.sg/context/sis_research/article/6632/viewcontent/Effort_aware_JIT_Alibaba_pv.pdf
• 機構: Singapore Management University

Effort-aware Just-in-Time (JIT) defect identification aims at identifying defect-introducing changes just-in-time with limited code inspection effort. Such identification has two benefits compared with traditional module-level defect identification, i.e., identifying defects in a more cost-effective...